In time, the expansion of This method to a complete wafer, or improved, the use of a superior resolution X-ray diffraction imaging (XRDI) approach, to make an entire 3D defect map with the Smart Slice layer might be practical to show the defect density above The full wafer. The impact https://www.quora.com/profile/Trevor-Flatcher-2/The-Versatile-Applications-of-Silicon-Carbide-Special-Ceramics-in-Modern-Industries-Silicon-carbide-SiC-special-ceram